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C1207M MWIR 1280×1024 7 5μm MCT Cooled Infrared Detector
C1207M MWIR 1280×1024 7 5μm MCT Cooled Infrared Detector

C1207M
MWIR 1280×1024/7.5μm MCT Cooled Infrared Detector

The C1207M HD MWIR cooled infrared detector features a 1280×1024 megapixel focal plane array with an industry-leading 7.5μm pixel size—delivering four times the pixel count of conventional 640×512 detectors over the same target area, revealing significantly more image detail. Despite its high-resolution imaging capability, the device maintains a compact form factor. Combining high resolution, superior performance, and exceptional reliability, the C1207M is an ideal infrared core component for applications requiring outstanding long-range detection and fine image detail recognition.

Main Features

Megapixel Resolution, Ultra-small Pixel Size
Megapixel Resolution, Ultra-small Pixel Size
  • 1280×1024 megapixel high-definition imaging for a wider field of view

  • Ultra-small 7.5μm pixel size delivers high spatial resolution and extended detection range


Compact Design Saving for More Space
Compact Design Saving for More Space
  • Smaller size and lighter weight

  • Lower power consumption for easy system integration

High Versatility, Reliable Delivery
High Versatility, Reliable Delivery
  • Customizable F-number

  • Mass production with excellent consistency


Specifications

ModelC1207M HD MWIR Cooled Infrared Detector
Sensitive MaterialMCT
Resolution1280×1024
Pixel Size7.5μm
Spectral Response3.7μm±0.2μm~4.8μm±0.2μm
Working ModeSnapshot
ITR/IWR Integration Modes
Windows Mode
Anti-blooming
Charge Capacity2.5Me-(ITR)
2.4Me-(IWR)
Dynamic Range≥76dB
Output Channel4 or 8 Channels; Up to 20MHz per output
Max. Frame Rate100Hz
Typical NETD25mK(F2/F4)
Effective Pixel Rate≥99.5%
Response Non-uniformity≤8%
Configurable CryocoolerRS046
Steady Power Consumption(23℃)≤6.5W
Max. Power Consumption(71℃)≤15W
Power Supply32V DC
Cooling Time(23℃)≤5min30s
Weight(g)≤350
Maximum Size (mm)120×46.5×81.5
Operating Temperature-45℃~+71℃


Applications

Learn More >>
Chip Material Research
Chip Material Research
Long Range Monitoring
Long Range Monitoring
Non Destructive Testing
Non Destructive Testing
PCBA Inspection
PCBA Inspection
  • 1280×1024/10μm

  • Sharp Image Quality

  • Customizable F-number

  • Multiple Crycooler Options

  • Sharp Image Quality

  • Long Detection Range

  • 1280×1024/15μm

  • Sharp Image Quality

  • Plug-and-play

  • 1280×1024/10μm

  • Long-Wave Detection

  • T2SL Technology

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