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C2510H HOT MWIR 2560×2048 10μm T2SL Cooled Infrared Detector
C2510H HOT MWIR 2560×2048 10μm T2SL Cooled Infrared Detector

C2510H
HOT MWIR 2560×2048/10μm T2SL Cooled Infrared Detector

The C2510H high operating temperature (HOT) cooled infrared detector features an ultra-large 2560×2048 resolution with a 10μm pixel size. Its industry-leading 5-megapixel resolution delivers exceptional image quality and an ultra-wide field of view, while maintaining stable power consumption at just 8W. With a lightweight design of only 750g and a cooling time as short as 8 minutes, it shows enormous potential in cutting-edge thermal imaging applications such as ultra-wide FOV observation, ultra-long-range detection, tiny object recognition, space exploration, and advanced scientific research.

Main Features

5-Megapixel Ultra-Large Array, Ultimate Observation Experience
5-Megapixel Ultra-Large Array, Ultimate Observation Experience
  • 2560×2048 ultra-large array for exceptional clarity and sharp detail

  • Meets the demands of ultra-wide field of view and ultra-long-range monitoring

Next-Level SWaP Optimization Powered by HOT
Next-Level SWaP Optimization Powered by HOT
  • Supports focal plane operating temperatures up to 150 K, with fast startup ≤8 min

  • Compact size≤ 86mm× 164mm×64 mm, low power consumption ≤8W

Type-II Superlattice Technology, Leading the Industry
Type-II Superlattice Technology, Leading the Industry
  • Excellent uniformity, high stability, and reliable mass production

Specifications

ModelC2510H HOT MWIR Cooled Infrared Detector
Sensitive MaterialT2SL
Resolution2560×2048
Pixel Size10μm
Spectral Response3.7±0.2μm~4.8±0.2μm
Typical NETD20mK(F2)
Max. Frame Rate100Hz
Effective Pixel Rate≥99.5%
Response Non-uniformity≤8%
Operating Temperature-45℃~+71℃
CryocoolerRS079G
Cooling Time(23℃)≤8min
Max. Power Consumption(71℃)≤35W
Steady Power Consumption(23℃)≤8W
Size(mm)86×164×64
Weight(g)≤750


Applications

Learn More >>
Chip Material Research
Chip Material Research
Long Range Monitoring
Long Range Monitoring
Non Destructive Testing
Non Destructive Testing
PCBA Inspection
PCBA Inspection
  • Advanced HOT Technology

  • 1280×1024/10μm

  • MTTF up to 25,000 Hours

  • Advanced HOT Technology

  • MTTF up to 25,000 Hours

  • SWaP

  • 1280×1024/10μm

  • Long-Wave Detection

  • T2SL Technology

  • Advanced HOT Technology

  • 1280×1024/7.5μm

  • MTTF up to 25,000 Hours

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