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C625S LWIR 640×512 25μm T2SL Cooled Infrared Detector
C625S LWIR 640×512 25μm T2SL Cooled Infrared Detector

C625S
LWIR 640×512/25μm T2SL Cooled Infrared Detector

The C625S LWIR cooled infrared detector is developed using an industry-leading Type-II Superlattice technology, featuring a 640×512 resolution with a 25μm pixel size. It is specifically designed for high-performance long-wave infrared (7.7–9.4μm) detection, offering high quantum efficiency, high frame rate, high sensitivity, low noise, and excellent non-uniformity. The C625S features a larger pixel size, providing a greater infrared-sensitive area for improved restoration of target thermal information. This significantly enhances the signal-to-noise ratio (SNR) advantage, while also offering strong anti-interference capability and the ability to detect low-temperature objects. It fully meets users’ demands for high SNR and long-range detection performance.

Main Features

Long-Wave Detection, Immune to Interference
Long-Wave Detection, Immune to Interference
  • Strong penetration capability in sand and dust, adaptable to complex environments

  • Unaffected by glare in strong sunlight or on water surfaces

  • Enhanced capability to detect low-temperature objects

High Versatility, Stable Supply
High Versatility, Stable Supply
  • Customizable F-number

  • Consistent quality in mass production

Specifications

ModelC625S LWIR Cooled Infrared Detector
Sensitive MaterialT2SL
Resolution640×512
Pixel Size25μm
Spectral Response7.7μm±0.2μm~9.4μm±0.3μm
Working ModeSnapshot
ITR Integration Mode
Windows Mode
Anti-blooming
Charge Capacity15.7Me-/21.8Me-(ITR)
Dynamic Range≥80dB
Output Channel4; Up to 20MHz per Output
Max. Frame Rate180Hz
Typical NETD20mK
Effective Pixel Rate≥99.5%
Response Non-uniformity≤8%
Configurable CryocoolerRS079
Steady Power Consumption(23℃)≤15W
Max. Power Consumption(71℃)≤25W
Power Supply24V DC
Cooling Time(23℃)≤7min
Maximum Size(mm)148×59×78
Weight(g)≤650
Operating Temperature-45℃~+71℃


Applications

Learn More >>
Chip Material Research
Chip Material Research
Long Range Monitoring
Long Range Monitoring
Non Destructive Testing
Non Destructive Testing
PCBA Inspection
PCBA Inspection
  • Sharp Image Quality

  • Excellent signal-to-noise ratio

  • High Sensitivity

  • Sharp Image Quality

  • Multiple Crycooler Options

  • High Sensitivity

  • Long-Wave Detection

  • T2SL Technology

  • Immune to Interference

  • Advanced HOT Technology

  • MTTF ≥ 25,000 h

  • SWaP

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